Abstract:
Today's demand to produce smaller electronic products for high-speed digital, mobile, and RF applications at very tight conductor pitches can result in very serious reliability issues. A typical PWB will contain several interacting conductors ranging from mechanically drilled holes, microvias, and inner planes at very tight spacing. In the past, electrochemical corrosion failure modes such as CAF were restricted to high-voltage applications. In modern day electronics, CAF failure concerns is important for low-voltage applications due to the tighter conductor spacing, which results in higher voltage gradients, and hence increased risks of CAF failure.
Presented by:
Dr. Antonio Caputo
Reliability Scientist, Analytical Services Lab, Isola Group